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Recovery and Stacking Faults of α Ag-Sn Alloys

Harsono Wirjosumarto

Abstract. X-ray diffraction peak shift can be used to determine the recovery temperature of face centered cubic metals. Using this method is was found that filed α Ag-Sn chips recover at temperature between 100 and 200C. The stacking fault energy was found to be decreasing with increasing tin content.


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