Measurement of Silica Crystallinity using X-Ray Diffraction Method
N.R. Herdianita, Ong H.L., E.A. Subroto & B. Priadi
Abstract. Mirralogy and the degree of crystallinity of non- and microcrystalline silica could be determined using the X-ray diffraction method, i.e. by measuring the half-width peak or hump at about 4Å. The optimum and most reproducible results were obtained when dry silica sample powder having a grain size of 75 to 106 μm was prepared at the aluminium holder and scanned from 10 to 40°2θ using goniometer speed of 0.6°2θ and a step size of 0.01°. This procedure will give an experimental error less than 0.3°2θ.
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